发明授权
- 专利标题: Antireflection film
- 专利标题(中): 防反射膜
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申请号: US511730申请日: 1995-08-07
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公开(公告)号: US5591517A公开(公告)日: 1997-01-07
- 发明人: Naoki Takamiya , Makoto Nakao , Akira Yazawa , Atumi Wakabayashi
- 申请人: Naoki Takamiya , Makoto Nakao , Akira Yazawa , Atumi Wakabayashi
- 申请人地址: JPX Tokyo
- 专利权人: Sumitomo Osaka Cement Co., Ltd.
- 当前专利权人: Sumitomo Osaka Cement Co., Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX5-240473 19930831; JPX6-226100 19940829
- 主分类号: B60K37/00
- IPC分类号: B60K37/00 ; G02B1/11 ; B32B3/26
摘要:
An antireflection film comprised of a transparent base material, a first layer with a refractive index N.sub.1 of 1.45-2.10, adhered onto the base material, and a second layer with a refractive index N.sub.2 at least 0.1 smaller than N.sub.1, adhered onto the first layer. Thickness D.sub.1 (nm) of the first layer is smaller than 0.5.multidot.L.sub.1 /N.sub.1, thickness D.sub.2 (nm) of the second layer is smaller than 0.5.multidot.L.sub.1 /N.sub.2 wherein L.sub.1 is a wavelength (nm) of a visible light, and at least said first layer contains a light absorber having a principal absorbing wavelength L.sub.2 (nm) satisfying the formula:(L.sub.1 +70).ltoreq.L.sub.2 or (L.sub.1 -50).gtoreq.L.sub.2.Alternatively, thickness D.sub.1 (nm) of the first layer is between 0.5-L.sub.1 /N.sub.1 and 0.75.multidot.L.sub.1 /N.sub.1, thickness D.sub.2 (nm) of the second layer is smaller than 0.5.multidot.L.sub.1 /N.sub.2, and at least said first layer contains a light absorber having a principal absorbing wavelength L.sub.2 (nm) satisfying the formula:(L.sub.1 -200).ltoreq.L.sub.2 .ltoreq.(L.sub.1 +200).
公开/授权文献
- US5055639A Contact arrangement for a vacuum switch 公开/授权日:1991-10-08
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