发明授权
- 专利标题: Position detecting method and projection exposure apparatus using the same
- 专利标题(中): 位置检测方法和使用其的投影曝光装置
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申请号: US70904申请日: 1993-06-04
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公开(公告)号: US5594549A公开(公告)日: 1997-01-14
- 发明人: Tetsuya Mori , Eiichi Murakami , Hirohiko Shinonaga
- 申请人: Tetsuya Mori , Eiichi Murakami , Hirohiko Shinonaga
- 申请人地址: JPX Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX4-171722 19920604
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; G03F9/00 ; H01L21/027 ; H01L21/30 ; G01N21/86
摘要:
A position detecting method includes illuminating a grating mark of an object with monochromatic light; forming an interference image on an image pickup device by using .+-. n-th order light (n=1, 2, 3 . . . ) among reflective diffraction light from the grating mark; integrating an image signal produced by the image pickup device within a two-dimensional window of a predetermined size set with respect to the image signal and along one direction in two-dimensional coordinates, whereby a one-dimensional projection integration signal is produced; transforming, through rectangular transformation, the one-dimensional projection integration signal into a spatial frequency region; selecting, on the spatial frequency region and from the one-dimensional projection integration signal, a spatial frequency component which appears in the interference image due to the periodicity of the grating mark; and detecting the position of the grating mark on the basis of the selection.
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