发明授权
- 专利标题: Method of handling wafers in a vacuum processing apparatus
- 专利标题(中): 在真空处理装置中处理晶片的方法
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申请号: US380713申请日: 1995-01-30
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公开(公告)号: US5636963A公开(公告)日: 1997-06-10
- 发明人: Hideo Haraguchi , Masaki Suzuki , Toshimichi Ishida
- 申请人: Hideo Haraguchi , Masaki Suzuki , Toshimichi Ishida
- 申请人地址: JPX
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JPX
- 优先权: JPX6-009225 19940131
- 主分类号: H01L21/677
- IPC分类号: H01L21/677 ; B65G49/07 ; C23C14/00 ; C23C16/54 ; H01L21/302 ; H01L21/68
摘要:
A vacuum processing apparatus includes a reaction chamber, a non-reaction chamber which is a load-lock chamber or a double load-lock chamber. A double arm is accommodated in the non-reaction chamber, and includes a first arm and a second arm for taking out a processed wafer from the reaction chamber and supplying an unprocessed wafer to the reaction chamber. Wafer elevating mechanisms are provided in the reaction chamber and the non-reaction chamber. The double arm and the wafer elevating mechanisms are driven by a single drive source. Also, a selective engagement mechanism is provided at the reaction chamber and at the non-reaction chamber for selectively engaging the driving source with any one of the wafer elevating mechanisms at the reaction chamber and the non-reaction chamber to drive the double arm and the wafer elevating mechanism at the selected chamber.
公开/授权文献
- US4463250A Method and apparatus for use against counterfeiting 公开/授权日:1984-07-31
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