发明授权
US5650617A Method for trapping ions into ion traps and ion trap mass spectrometer
system thereof
失效
将离子捕获到离子阱中的方法及其离子阱质谱仪系统
- 专利标题： Method for trapping ions into ion traps and ion trap mass spectrometer system thereof
- 专利标题（中）： 将离子捕获到离子阱中的方法及其离子阱质谱仪系统
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申请号： US688469申请日： 1996-07-30
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公开(公告)号： US5650617A公开(公告)日： 1997-07-22
- 发明人: Alex Mordehai
- 申请人： Alex Mordehai
- 申请人地址： CA Palo Alto
- 专利权人： Varian Associates, Inc.
- 当前专利权人： Varian Associates, Inc.
- 当前专利权人地址： CA Palo Alto
- 主分类号： H01J49/34
- IPC分类号： H01J49/34 ; H01J49/38 ; H01J49/42
摘要：
A method and mass spectrometer system for trapping ions within an ion trap by increasing the flight path of ions therein. An ion beam is produced by external ion source and is directed to the ion trap which comprises at least one trapping electrode in proximity to an exit region of the ion beam from the ion trap. A retarding DC voltage is applied to the trapping electrode during ion accumulation time for creating a fringing reflection field and for retaining ions within the ion trap.
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