发明授权
US5650626A X-ray imaging detector with thickness and composition limited substrate
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X射线成像检测器具有厚度和成分有限的基底
- 专利标题: X-ray imaging detector with thickness and composition limited substrate
- 专利标题(中): X射线成像检测器具有厚度和成分有限的基底
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申请号: US682910申请日: 1996-07-16
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公开(公告)号: US5650626A公开(公告)日: 1997-07-22
- 发明人: David P. Trauernicht , John Yorkston
- 申请人: David P. Trauernicht , John Yorkston
- 申请人地址: NY Rochester
- 专利权人: Eastman Kodak Company
- 当前专利权人: Eastman Kodak Company
- 当前专利权人地址: NY Rochester
- 主分类号: H01L27/146
- IPC分类号: H01L27/146 ; H04N5/32 ; G01T1/24 ; H01L27/04
摘要:
An ionizing radiation imaging detector, for use with a ionizing radiation beam source comprising a pixellated conversion-detection unit, and a substrate supporting the conversion-detection unit. The substrate includes one or more elements having atomic numbers greater than 22, the elements having a total concentration in the substrate of greater than about 1 mole percent relative to the total number of moles of elements having atomic numbers of 22 or less. The substrate has a dimensionless absorption exponent of less than 0.5 for gamma ray emission of Am.sup.241 at about 60 keV;whereAE(Am.sup.241 60 keV)=t*(k.sub.1 e.sub.1 +k.sub.2 e.sub.2 +k.sub.3 e.sub.3 + . . . )and wherein AE(Am.sup.241 60 keV) represents the absorption exponent of said substrate relative to the about 60 keV gamma ray emission of Am.sup.241 ; t represents said thickness of said substrate in the principle direction of propagation of said x-ray beam; e.sub.1, e.sub.2, e.sub.3, . . . represent the concentrations of elements in said substrate; and k.sub.1, k.sub.2, k.sub.3, . . . represent the mass attenuation coefficients of the respective elements.
公开/授权文献
- US5299396A Sunroof and method of installing same 公开/授权日:1994-04-05
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