发明授权
- 专利标题: Scanning electron microscope and its analogous device
- 专利标题(中): 扫描电子显微镜及其类似装置
-
申请号: US615650申请日: 1996-03-13
-
公开(公告)号: US5668372A公开(公告)日: 1997-09-16
- 发明人: Yuko Iwabuchi , Mitsugu Sato , Yoichi Ose
- 申请人: Yuko Iwabuchi , Mitsugu Sato , Yoichi Ose
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX7-059376 19950317
- 主分类号: H01J37/20
- IPC分类号: H01J37/20 ; H01J37/12 ; H01J37/153 ; H01J37/244 ; H01J37/28
摘要:
A device enables high resolution observation even when a sample is tiled. A deflecting electrode device for generating an electric field having a component in the direction perpendicular to the center axis (optical axis) of an objective lens is provided between the objective lens and the sample. A voltage applied to the deflecting electrode device is controlled in accordance with the tilting of a sample stage. A lateral electric field component generated on the optical axis when the sample stage is tiled is corrected by a deflected electric field generated by the deflecting electrode device. This is effective to suppress generation of astigmatism, and to allows effective arrival of an secondary electron at a secondary electron detector disposed at a position nearer the electron source side than the objective lens.
公开/授权文献
- US4568301A Magnetically controlled toy 公开/授权日:1986-02-04
信息查询