发明授权
- 专利标题: Assembly for measuring a trench depth parameter of a workpiece
- 专利标题(中): 用于测量工件的沟槽深度参数的组件
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申请号: US643090申请日: 1996-04-30
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公开(公告)号: US5691540A公开(公告)日: 1997-11-25
- 发明人: Scott D. Halle , Philip Charles Danby Hobbs , Tadashi Mitsui , Theodore G. van Kessel , Hemantha Kumar Wickramasinghe
- 申请人: Scott D. Halle , Philip Charles Danby Hobbs , Tadashi Mitsui , Theodore G. van Kessel , Hemantha Kumar Wickramasinghe
- 申请人地址: NY Armonk
- 专利权人: IBM Corporation
- 当前专利权人: IBM Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: G01B11/22
- IPC分类号: G01B11/22
摘要:
An assembly for measuring a trench depth parameter of a workpiece is disclosed. The assembly has an ultra-violet radiation source; a split fiber bundle having a first branch for propagating the ultra-violet radiation from the radiation source to a lens, and a second branch; a lens for focusing the UV radiation to the workpiece and refocusing an ultra-violet interference signal to the second branch; and a detector responsive to the ultra-violet interference signal received through the second branch. The detector transforms the ultra-violet interference signal to an electrical signal which is a measure of a trench depth of the workpiece. The ultra-violet interference signal is developed when ultra-violet radiation propagates through the workpiece and reflects from its base region to thereby interfere with ultra-violet radiation that is directly reflected by a workpiece surface which is different from the base region.
公开/授权文献
- US4525234A Adhesive, pre-gelled plastisols and process of preparation 公开/授权日:1985-06-25
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