发明授权
- 专利标题: Apparatus for detecting a mark pattern on a substrate
- 专利标题(中): 用于检测基板上的标记图案的装置
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申请号: US639099申请日: 1996-04-26
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公开(公告)号: US5706091A公开(公告)日: 1998-01-06
- 发明人: Naomasa Shiraishi
- 申请人: Naomasa Shiraishi
- 申请人地址: JPX Tokyo
- 专利权人: Nikon Corporation
- 当前专利权人: Nikon Corporation
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX7-106556 19950428; JPX7-136783 19950602
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; G03F9/00 ; G01B11/00
摘要:
Illuminating light at a pupil plane of an illumination optical system for illuminating a position detection mark on a substrate is limited to an annular area centered at an optical axis, and a member substantially blocks an image-forming light beam distributed over an area on a pupil plane of an image-forming optical system for forming an image of the position detection mark on an imaging device by receiving light generated from the mark, the area being in image-forming relation to the annular area on the pupil plane of the illumination optical system. Alternatively, a member gives a phase difference of approximately .pi./2 �rad! between the image-forming light beam distributed over the area which is in image-forming relation to the annular area on the pupil plane of the illumination optical system and the image-forming light beam distributed over the area other than that area.
公开/授权文献
- US4554223A Fuel cell apparatus 公开/授权日:1985-11-19