发明授权
- 专利标题: Variable temperature semiconductor film deposition
- 专利标题(中): 可变温度半导体膜沉积
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申请号: US555621申请日: 1995-11-09
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公开(公告)号: US5712187A公开(公告)日: 1998-01-27
- 发明人: Xiaonan Li , Peter Sheldon
- 申请人: Xiaonan Li , Peter Sheldon
- 申请人地址: MO Kansas City
- 专利权人: Midwest Research Institute
- 当前专利权人: Midwest Research Institute
- 当前专利权人地址: MO Kansas City
- 主分类号: H01L21/203
- IPC分类号: H01L21/203 ; H01L21/363 ; H01L31/073 ; H01L31/18 ; H01L21/20
摘要:
A method of depositing a semiconductor material on a substrate. The method sequentially comprises (a) providing the semiconductor material in a depositable state such as a vapor for deposition on the substrate; (b) depositing the semiconductor material on the substrate while heating the substrate to a first temperature sufficient to cause the semiconductor material to form a first film layer having a first grain size; (c) continually depositing the semiconductor material on the substrate while cooling the substrate to a second temperature sufficient to cause the semiconductor material to form a second film layer deposited on the first film layer and having a second grain size smaller than the first grain size; and (d) raising the substrate temperature, while either continuing or not continuing to deposit semiconductor material to form a third film layer, to thereby anneal the film layers into a single layer having favorable efficiency characteristics in photovoltaic applications. A preferred semiconductor material is cadmium telluride deposited on a glass/tin oxide substrate already having thereon a film layer of cadmium sulfide.
公开/授权文献
- US5066881A Semi-conducting layer for insulated electrical conductors 公开/授权日:1991-11-19
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