发明授权
- 专利标题: Method for producing a low resistivity polycide
- 专利标题(中): 低电阻率聚硅氧烷的制造方法
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申请号: US674081申请日: 1996-07-01
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公开(公告)号: US5712196A公开(公告)日: 1998-01-27
- 发明人: Effiong E. Ibok
- 申请人: Effiong E. Ibok
- 申请人地址: CA Sunnyvale
- 专利权人: Advanced Micro Devices, Inc.
- 当前专利权人: Advanced Micro Devices, Inc.
- 当前专利权人地址: CA Sunnyvale
- 主分类号: H01L21/28
- IPC分类号: H01L21/28 ; H01L21/283
摘要:
A semiconductor fabrication technique is provided for producing a low resistivity polycide. Polycide resistivity is lowered by minimizing areas where the polycide is unduly thin. By preparing the polysilicon upper surface prior to polycide formation thereon, the polysilicon surface can grow polycide at a uniform rate across the entire polysilicon surface. The polysilicon surface is prepared by either restricting doping atoms at grain boundary locations at the polysilicon surface, or by disrupting the grain boundaries by ion implanting that surface. In either instance, a properly prepared polysilicon surface greatly enhances the conductivity of polycide grown thereon.
公开/授权文献
- US5107679A Safety valve for discharge chutes on cement mixer 公开/授权日:1992-04-28
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