发明授权
- 专利标题: Semiconductor memory device
- 专利标题(中): 半导体存储器件
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申请号: US658081申请日: 1996-06-04
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公开(公告)号: US5715190A公开(公告)日: 1998-02-03
- 发明人: Shigeru Honjo , Kazumasa Yanagisawa , Kiyoshi Inoue
- 申请人: Shigeru Honjo , Kazumasa Yanagisawa , Kiyoshi Inoue
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX6-062108 19940307
- 主分类号: G11C14/00
- IPC分类号: G11C14/00 ; G11C11/22 ; H01L21/8246 ; H01L27/10 ; H01L27/105
摘要:
A memory matrix--which comprises memory cells arranged in matrix, each made up of a ferroelectric capacitor and an address selection MOSFET--is divided for each word line into a plurality of memory blocks. Each of the memory blocks is provided with a mode storage circuit that stores a DRAM mode (volatile mode) or an NV mode (non-volatile mode) in one-to-one correspondence for each memory block, and with a refresh operation count circuit that counts for each memory block the number of times the refresh operations is performed consecutively. During an n-th refresh operation (where n is a predetermined number of times), a memory access is made to temporarily change the plate voltage of the ferroelectric capacitor from one voltage to another and at the same time the mode storage circuit is changed from the DRAM mode to the NV mode. When a read or write operation to and from a memory cell in the memory block is performed, the mode storage circuit is changed from the NV mode to the DRAM mode. The refresh operation is omitted for the memory block that was set to the NV mode according to the stored information in the mode storage circuit.
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