发明授权
- 专利标题: Gas analyzer with arrangement for spray-cleaning optical element
- 专利标题(中): 气体分析仪,用于喷涂清洁光学元件
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申请号: US801108申请日: 1997-02-13
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公开(公告)号: US5720650A公开(公告)日: 1998-02-24
- 发明人: Ganapati R. Mauze , George W. Hopkins, II , Tad Decatur Simons
- 申请人: Ganapati R. Mauze , George W. Hopkins, II , Tad Decatur Simons
- 申请人地址: CA Palo Alto
- 专利权人: Hewlett-Packard Company
- 当前专利权人: Hewlett-Packard Company
- 当前专利权人地址: CA Palo Alto
- 主分类号: G01N21/15
- IPC分类号: G01N21/15 ; G01N33/00 ; G01N33/497 ; B24C3/00
摘要:
A gas analysis apparatus for analysis of sample gas wherein the apparatus has a mechanism for cleaning optical elements such as reflectors and windows in the apparatus is provided. The gas analysis apparatus includes a light source for emitting light, a body having an isolated cavity in which the light emitted by the light source propagates, a detector for analyzing light scattered by the sample gas in the isolated cavity, and a spraying system connected to the body to spray a sublimable substance. The isolated cavity has one or more optical elements each with a surface. The spray of the sublimable substance is directed onto such a surface for in situ removal of contaminants. The body has a sample inlet port for introducing the sample gas into the cavity and an outlet port for venting gas from the cavity.
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