An integrated memory circuit is described which can be operated in a burst access mode. The memory circuit includes an address counter which changes column addresses in one of a number of predetermined patterns. The column address is changes in response to a rising edge of a column address signal (CAS*). The memory also includes a buffer circuit which latches the output of the address counter in response to the falling edge of the column address signal. Memory cells are accessed in a burst manner on the falling edge of the column address signal using the address latched in the buffer.