A testable electronic system includes testable elements having standardized test interfaces for organizing the elements in chains which behave like shift registers to ensure the exchange of test information. Each element are either a component including an identifier characterizing the behavior of the test of the component and accessible by the test interface of the component, or a switch for organizing a chain in sub-chains which can be individually selected through channels of the switch. The system includes master switches which define respective sub-sets of elements, a specific channel of each master switch being reserved to access an identifier characterizing the test organization of the associated sub-set.