发明授权
- 专利标题: X-ray diagnostic apparatus
- 专利标题(中): X光诊断仪
-
申请号: US811287申请日: 1997-03-04
-
公开(公告)号: US5761268A公开(公告)日: 1998-06-02
- 发明人: Erich Hell , Gustav-Adolf Voss
- 申请人: Erich Hell , Gustav-Adolf Voss
- 申请人地址: DEX Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DEX Munich
- 优先权: DEX19608497.0 19960305
- 主分类号: A61B6/00
- IPC分类号: A61B6/00 ; A61B6/03 ; G01N23/04 ; G01T1/29 ; G03B42/02 ; H01J35/02 ; H01J35/14 ; H05G2/00 ; H01J35/30
摘要:
In an X-ray diagnostic apparatus, for acquiring the cross-section, position and/or alignment, relative to a target, of an electron beam generated by an electron generating system, at least one conductor is provided in the region of the target so that a signal can be derived by the conductor under the influence of the electron beam and supplied to an evaluation stage. The conductor is composed of a material having an atomic number lower than that of tungsten, so that no undesirable radiation arises due to the interaction of the electrons with this conductor.
公开/授权文献
- US4687241A Gripper head 公开/授权日:1987-08-18