发明授权
US5761489A Method and apparatus for scan testing with extended test vector storage
in a multi-purpose memory system
失效
用于多用途存储器系统中具有扩展测试向量存储的扫描测试的方法和装置
- 专利标题： Method and apparatus for scan testing with extended test vector storage in a multi-purpose memory system
- 专利标题（中）： 用于多用途存储器系统中具有扩展测试向量存储的扫描测试的方法和装置
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申请号： US422467申请日： 1995-04-17
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公开(公告)号： US5761489A公开(公告)日： 1998-06-02
- 发明人: James L. Broseghini , John A. Langan , Thomas J. Poterek
- 申请人： James L. Broseghini , John A. Langan , Thomas J. Poterek
- 申请人地址： IL Shaumburg
- 专利权人： Motorola Inc.
- 当前专利权人： Motorola Inc.
- 当前专利权人地址： IL Shaumburg
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G01R31/3185 ; G06F11/22 ; G06F11/267 ; G06F11/26
摘要：
A data processor (12) has built-in circuitry for scan testing certain circuits. The data processor generates and stores test vectors in a memory system (22) normally used for data and instruction storage. These vectors can be much larger than the size of any scan chain. During testing, the stored vectors are automatically routed to the circuits to be tested (36, 38) and the outputs compared to a benchmark. The data processor (12) need not pause to generate additional test vectors. Therefore, the data processor (12) can use a single circuit to generate scan data and compress scan results with minimal timing or size implications.