- 专利标题: Apparatus for polishing peripheral portion of wafer
-
申请号: US567162申请日: 1995-12-05
-
公开(公告)号: US5766065A公开(公告)日: 1998-06-16
- 发明人: Fumihiko Hasegawa , Yasuyoshi Kuroda , Koichiro Ichikawa , Yasuo Inada
- 申请人: Fumihiko Hasegawa , Yasuyoshi Kuroda , Koichiro Ichikawa , Yasuo Inada
- 申请人地址: JPX Tokyo JPX Nagano
- 专利权人: Shin-Etsu Handotai Co., Ltd.,Fujikoshi Machinery Corp.
- 当前专利权人: Shin-Etsu Handotai Co., Ltd.,Fujikoshi Machinery Corp.
- 当前专利权人地址: JPX Tokyo JPX Nagano
- 优先权: JPX6-332682 19941213
- 主分类号: B24B9/00
- IPC分类号: B24B9/00 ; B24B9/06 ; H01L21/304 ; B24B5/00
摘要:
A polishing apparatus of a peripheral chamfered portion of a semiconductor wafer is disclosed. The polishing apparatus comprises: a rotary drum around the periphery of which a tape having an abrasive layer thereon is wound; a first motor for rotating the rotary drum; a wafer holding mechanism which comprises a wafer holding member for holding a wafer, a second motor for rotating the wafer holding member, a supporting member for supporting the wafer holding member and the second motor, and a wafer inclining member for changing the tilt angle of the wafer with respect to the rotary drum by reciprocally rotating the supporting member on a first axis which is substantially parallel with the main surface of the wafer; and a moving member for bringing the wafer held on the supporting member into contact with or separating it from the tape wound around the rotary drum.
公开/授权文献
- US4630477A Thermistor liquid-level sensing probe 公开/授权日:1986-12-23
信息查询