发明授权
US5768189A Circuitry and method for stabilizing operating characteristics of memory against temperature variations 失效
用于稳定存储器的工作特性以抵抗温度变化的电路和方法

  • 专利标题: Circuitry and method for stabilizing operating characteristics of memory against temperature variations
  • 专利标题(中): 用于稳定存储器的工作特性以抵抗温度变化的电路和方法
  • 申请号: US826047
    申请日: 1997-03-28
  • 公开(公告)号: US5768189A
    公开(公告)日: 1998-06-16
  • 发明人: Mariko Takahashi
  • 申请人: Mariko Takahashi
  • 申请人地址: JPX Tokyo
  • 专利权人: NEC Corporation
  • 当前专利权人: NEC Corporation
  • 当前专利权人地址: JPX Tokyo
  • 主分类号: G11C5/14
  • IPC分类号: G11C5/14 G11C16/10 G11C16/30 G11C7/00
Circuitry and method for stabilizing operating characteristics of memory
against temperature variations
摘要:
In a matrix array of memory cells, each memory cell includes a control gate, and first and second terminals for defining a channel therebetween, with the second terminals of the memory cells being connected to a common circuit node. During a write modes a row of memory cells and a column of memory cells are selected, and a first voltage is supplied to the control gates of the memory cells of the selected row and a second voltage which varies positively as a function of temperature is supplied to the first terminals of the memory cells of the selected column for trapping electrons in at least one of the memory cells. During an erase mode, ground potential is supplied to the control gates of all memory cells and a third voltage which varies negatively as a function of temperature is supplied to the common circuit node to remove the trapped electrons from the memory cells.
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