发明授权
- 专利标题: Reduced gate error detection and correction circuit
- 专利标题(中): 减少门误差检测和校正电路
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申请号: US414064申请日: 1995-03-31
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公开(公告)号: US5774481A公开(公告)日: 1998-06-30
- 发明人: Patrick James Meaney , Chin-Long Chen
- 申请人: Patrick James Meaney , Chin-Long Chen
- 申请人地址: NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: G06F11/10
- IPC分类号: G06F11/10 ; H03M13/13 ; H03M13/00
摘要:
Error detection and correction circuitry, optimized to reduce the time required to correct single errors and to detect the presence of uncorrectable errors, uses an optimized H-Matrix and provides reduced logic circuitry. Correctable error syndromes are defined as comprising an odd number of ones and an uncorrectable-error detection circuit generates an uncorrectable-error indication when an even number of ones are detected. The correctable-error syndromes are defined as having a predefined combination of ones and zeros in each of a set of corresponding bit positions and different combinations of ones and zeros in other bit position. An error syndrome comprising only zeros is designated as indicative of a no error condition. Logic circuitry is provided which implements the error detection and correction circuitry with a reduced set of logic gates.
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