- 专利标题: Large angle solid state position sensitive x-ray detector system
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申请号: US916378申请日: 1997-08-22
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公开(公告)号: US5784432A公开(公告)日: 1998-07-21
- 发明人: David S. Kurtz , Clay O. Ruud
- 申请人: David S. Kurtz , Clay O. Ruud
- 申请人地址: PA University Park CT Danbury
- 专利权人: The Penn State Research Foundation,Advanced Technology Materials, Inc.
- 当前专利权人: The Penn State Research Foundation,Advanced Technology Materials, Inc.
- 当前专利权人地址: PA University Park CT Danbury
- 主分类号: G01N23/20
- IPC分类号: G01N23/20 ; G01T1/20
摘要:
A method and apparatus for x-ray measurement of certain properties of a solid material. In distinction to known methods and apparatus, this invention employs a specific fiber-optic bundle configuration, termed a reorganizer, itself known for other uses, for coherently transmitting visible light originating from the scintillation of diffracted x-radiation from the solid material gathered along a substantially one dimensional linear arc, to a two-dimensional photo-sensor array. The two-dimensional photodetector array, with its many closely packed light sensitive pixels, is employed to process the information contained in the diffracted radiation and present the information in the form of a conventional x-ray diffraction spectrum. By this arrangement, the angular range of the combined detector faces may be increased without loss of angular resolution. Further, the prohibitively expensive coupling together of a large number of individual linear diode photodetectors, which would be required to process signals generated by the diffracted radiation, is avoided.
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