公开(公告)号：US12065929B2

公开(公告)日：2024-08-20

申请号：US17647814

申请日：2022-01-12

申请人： Saudi Arabian Oil Company

发明人： Ferney Geovany Moreno Sierra ,  Ahmad Azly Bin Abdul Aziz ,  Neil W. Craigie ,  Faisal S. Al Reshedan ,  Nawaf Aldossary

IPC分类号： E21B7/04 ,  E21B44/00 ,  G01N23/20 ,  G01N23/223 ,  G01N33/24

CPC分类号： E21B7/04 ,  E21B44/00 ,  G01N23/20 ,  G01N23/223 ,  G01N33/24 ,  E21B2200/20 ,  G01N2223/05 ,  G01N2223/076 ,  G01N2223/616

摘要： A system and methods for petro-steering methodologies are provided. An exemplary method obtains rock fabric data, and integrate rock fabric data with dynamic productivity data to identify patterns between the rock fabric data and dynamic productivity data. Gas rates and steering values are predicted across UBCT wells based on the patterns.

公开(公告)号：US12017216B2

公开(公告)日：2024-06-25

申请号：US17141786

申请日：2021-01-05

申请人： Roche Diagnostics Operations, Inc.

发明人： Andreas Drechsler ,  Darko Klinec ,  Michael Koehler ,  Alexander Jakob ,  Michael Zeder

IPC分类号： B01L3/00 ,  G01F23/284 ,  G01F23/292 ,  G01F23/80 ,  G01N23/20 ,  G01N23/20091 ,  G01N35/00 ,  G01N21/3577 ,  G01N21/3581

CPC分类号： B01L3/502715 ,  G01F23/284 ,  G01F23/292 ,  G01F23/804 ,  G01N23/20091 ,  G01N35/00732 ,  B01L2300/1861 ,  G01N21/3577 ,  G01N21/3581

摘要： A method to process a laboratory carrier in a laboratory system based on a feature of a test liquid in the laboratory carrier is presented. The laboratory system comprises the laboratory carrier comprising the test liquid, a terahertz wave source, a terahertz detector, a laboratory carrier processing device, and a control unit. Using terahertz technology and data analysis, the feature of the test liquid in the laboratory carrier can be determined. In addition, the control unit controls the laboratory carrier processing device based on the determined feature of the test liquid.

公开(公告)号：US20240103013A1

公开(公告)日：2024-03-28

申请号：US18359483

申请日：2023-07-26

申请人： VIB VZW ,  Vrije Universiteit Brussel ,  The Board of Trustees of the Leland Stanford Junior University

发明人： Jan Steyaert ,  Els Pardon ,  Soren G.F. Rasmussen ,  Juan Jose Fung ,  Brian Kobilka ,  Toon Laeremans

IPC分类号： G01N33/68 ,  C07K14/705 ,  C07K14/72 ,  C07K16/28 ,  G01N23/20 ,  G01N33/566

CPC分类号： G01N33/6872 ,  C07K14/705 ,  C07K14/723 ,  C07K16/28 ,  G01N23/20 ,  G01N33/566 ,  G01N33/68 ,  G01N33/6857 ,  A61K38/00

摘要： The present invention relates to the field of GPCR structure biology and signaling. In particular, the present invention relates to protein binding domains directed against or capable of specifically binding to a functional conformational state of a G-protein-coupled receptor (GPCR). More specifically, the present invention provides protein binding domains that are capable of increasing the stability of a functional conformational state of a GPCR, in particular, increasing the stability of a GPCR in its active conformational state. The protein binding domains of the present invention can be used as a tool for the structural and functional characterization of G-protein-coupled receptors bound to various natural and synthetic ligands, as well as for screening and drug discovery efforts targeting GPCRs. Moreover, the invention also encompasses the diagnostic, prognostic and therapeutic usefulness of these protein binding domains for GPCR-related diseases.

公开(公告)号：US11940757B2

公开(公告)日：2024-03-26

申请号：US17353943

申请日：2021-06-22

申请人： Accelerate Diagnostics, Inc.

发明人： Oleg Gusyatin

IPC分类号： G03H1/10 ,  C12M1/34 ,  G01N15/02 ,  G01N15/0227 ,  G01N15/10 ,  G01N15/14 ,  G01N15/1434 ,  G01N23/20 ,  G02B21/00 ,  G02B21/36 ,  G03H1/00 ,  G03H1/04 ,  G03H1/08 ,  G03H1/26

CPC分类号： G03H1/10 ,  C12M41/36 ,  G01N15/0227 ,  G01N15/1434 ,  G01N15/1475 ,  G01N23/20 ,  G02B21/0008 ,  G02B21/365 ,  G03H1/0443 ,  G01N2015/0233 ,  G01N2015/1006 ,  G01N2015/1454 ,  G01N2015/1493 ,  G01N2015/1497 ,  G03H2001/0033 ,  G03H2001/0447 ,  G03H1/0866 ,  G03H2001/2655 ,  G03H2222/13 ,  G03H2222/52 ,  G03H2226/13 ,  G03H2227/03

摘要： Disclosed are optical interrogation apparatus that can produce lens-free images using an optoelectronic sensor array to generate a holographic image of sample objects, such as microorganisms in a sample. Also disclosed are methods of detecting and/or identifying microorganisms in a biological sample, such as microorganisms present in low levels. Also disclosed are methods of using systems to detect microorganisms in a biological sample, such as microorganisms present in low levels. In addition or as an alternative, the methods of using systems may identify microorganisms present in a sample and/or determine antimicrobial susceptibility of such microorganisms.

公开(公告)号：US11927549B2

公开(公告)日：2024-03-12

申请号：US17470183

申请日：2021-09-09

申请人： KLA Corporation

发明人： Qian Zhang ,  Wayne Chiwoei Lo ,  Joseph Maurino ,  Tomas Plettner

IPC分类号： G01N23/20 ,  G01N23/20008 ,  H01F7/02 ,  H05K9/00

CPC分类号： G01N23/20008 ,  H01F7/0273 ,  H05K9/0075 ,  G01N2223/052 ,  G01N2223/20 ,  G01N2223/30

摘要： The present disclosure provides an inspection system and a method of stray field mitigation. The system includes an array of electron beam columns, a first permanent magnet array, and a plurality of shielding plates. The array of electron beam columns each includes an electron source configured to emit electrons toward a stage. The first permanent magnet array is configured to condense the electrons from each electron source into an array of electron beams. The first permanent magnet array is arranged at a first end of the array of electron beam columns. The plurality of shielding plates extend across the array electron beam columns downstream of the first permanent magnet array in a direction of electron emission. The array of electron beams pass through a plurality of apertures in each of the plurality of shielding plates, which reduces stray magnetic field in a radial direction of the array of electron beams.

公开(公告)号：US11913890B1

公开(公告)日：2024-02-27

申请号：US18281237

申请日：2022-01-06

申请人： Halo X Ray Technologies Limited

发明人： Anthony Dicken ,  Daniel Spence

IPC分类号： G01N23/10 ,  G01N23/044 ,  G01N23/087 ,  G01N23/20 ,  G01N23/20008 ,  G01N23/20091 ,  G01N23/205 ,  G01N23/2055

CPC分类号： G01N23/10 ,  G01N23/044 ,  G01N23/087 ,  G01N23/20008 ,  G01N23/20083 ,  G01N23/20091 ,  G01N23/205 ,  G01N23/2055 ,  G01N2223/045 ,  G01N2223/0561 ,  G01N2223/0563 ,  G01N2223/0566 ,  G01N2223/1016 ,  G01N2223/316 ,  G01N2223/3306 ,  G01N2223/401 ,  G01N2223/402 ,  G01N2223/403 ,  G01N2223/41 ,  G01N2223/419 ,  G01N2223/421 ,  G01N2223/423 ,  G01N2223/639

摘要： There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.

公开(公告)号：US11903755B2

公开(公告)日：2024-02-20

申请号：US16910088

申请日：2020-06-24

申请人： Weng-Dah Ken ,  Fang-Chi Kan

发明人： Weng-Dah Ken ,  Fang-Chi Kan

IPC分类号： A61B6/00 ,  G01N37/00 ,  G01B9/02 ,  H01J37/244 ,  G01N23/20 ,  H01J37/26 ,  G01B15/00 ,  G04F5/14 ,  H01J37/04

CPC分类号： A61B6/4258 ,  A61B6/4035 ,  G01B9/02 ,  G01B15/00 ,  G01N23/20 ,  G01N37/005 ,  G04F5/14 ,  H01J37/04 ,  H01J37/244 ,  H01J37/26 ,  G01B2290/55 ,  H01J2237/06383 ,  H01J2237/24557 ,  H01J2237/24571 ,  H01J2237/24578 ,  H01J2237/24585 ,  H01J2237/2614

摘要： A non-contact angle measuring apparatus includes a matter-wave and energy (MWE) particle source and a detector. The MWE particle source is used for generating boson or fermion particles. The detector is used for detecting a plurality peaks or valleys of an interference pattern generated by 1) the boson or fermion particles corresponding to a slit, a bump, or a hole of a first plane and 2) matter waves' wavefront-split associated with the boson or fermion particles reflected by a second plane, wherein angular locations of the plurality peaks or valleys of the interference pattern, a first distance between a joint region of the first plane and the second plane, and a second distance between the detector and the slit are used for deciding an angle between the first plane and the second plane.

公开(公告)号：US20240044819A1

公开(公告)日：2024-02-08

申请号：US18346778

申请日：2023-07-03

申请人： NOVA LTD.

发明人： Gilad BARAK

IPC分类号： G01N23/2055 ,  H01L21/66 ,  G06T7/00 ,  G06T5/00 ,  G01N23/201 ,  G01N23/20

CPC分类号： G01N23/2055 ,  H01L22/12 ,  G06T7/0004 ,  G06T5/002 ,  G01N23/201 ,  G01N23/20 ,  G01N2223/6116 ,  G06T2207/30148 ,  G06T2207/20224 ,  G06T2207/10116 ,  G01N2223/401 ,  G01N23/207

摘要： A method and system are presented for use in X-ray based measurements on patterned structures. The method comprises: processing data indicative of measured signals corresponding to detected radiation response of a patterned structure to incident X-ray radiation, and subtracting from said data an effective measured signals substantially free of background noise, said effective measured signals being formed of radiation components of reflected diffraction orders such that model based interpretation of the effective measured signals enables determination of one or more parameters of the patterned structure, wherein said processing comprises: analyzing the measured signals and extracting therefrom a background signal corresponding to the background noise; and applying a filtering procedure to the measured signals to subtract therefrom signal corresponding to the background signal, resulting in the effective measured signal.

公开(公告)号：US11859965B2

公开(公告)日：2024-01-02

申请号：US17736107

申请日：2022-05-04

申请人： GlobalWafers Co., Ltd.

发明人： Shang-Chi Wang ,  Wen-Ching Hsu ,  Chia-Chi Tsai ,  I-Ching Li

IPC分类号： G01N23/00 ,  G01B15/04 ,  G01N23/20

CPC分类号： G01B15/04 ,  G01N23/20 ,  G01N2223/056

摘要： A material analysis method is provided. A plurality of wafers processed from a plurality of ingots are measured by a measuring instrument to obtain an average of a bow of each of the wafers processed from the ingots and a plurality of full widths at half maximum (FWHM) of each of the wafers. Key factors respectively corresponding to the ingots are calculated according to the FWHM of the wafers. A regression equation is obtained according to the key factors and the average of the bows.

公开(公告)号：US20230417687A1

公开(公告)日：2023-12-28

申请号：US17808674

申请日：2022-06-24

申请人： SANDISK TECHNOLOGIES LLC

发明人： Shogo TOMITA ,  Tatsuya HINOUE ,  Michiaki SANO

IPC分类号： G01N23/18 ,  G01N23/083 ,  G01N23/20 ,  H01L21/66

CPC分类号： G01N23/18 ,  G01N23/083 ,  G01N23/20 ,  H01L22/12 ,  G01N2223/6116 ,  G01N2223/646 ,  G01N2223/401 ,  H01L27/11556

摘要： Systems and methods for non-destructive inspection of semiconductor devices, such as three-dimensional NAND memory device, using reflective X-ray microscope computed tomographic (CT) imaging. An X-ray microscope directs a focused beam of X-ray radiation at an oblique angle onto the surface of a semiconductor wafer such that the beam passes through device structures and at least a portion of the beam is reflected by a semiconductor substrate of the wafer and detected by an X-ray detector. The wafer may be rotated about a rotation axis to obtain X-ray images of a region-of-interest (ROI) at different projection angles. A processing unit uses detected X-ray image data obtained by the X-ray detector at the different projection angles to generate a CT reconstructed image of the ROI. The CT reconstructed image may enable inspection of internal structural features, including embedded defects, in the semiconductor device in a non-destructive manner