Invention Grant
- Patent Title: Method of detecting possible defect of liquid crystal panel
- Patent Title (中): 检测液晶面板缺陷的方法
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Application No.: US762155Application Date: 1996-12-09
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Publication No.: US5786707APublication Date: 1998-07-28
- Inventor: Takafumi Hayama , Katsumi Irie
- Applicant: Takafumi Hayama , Katsumi Irie
- Applicant Address: JPX Osaka
- Assignee: Sharp Kabushiki Kaisha
- Current Assignee: Sharp Kabushiki Kaisha
- Current Assignee Address: JPX Osaka
- Priority: JPX7-319314 19951207
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G02F1/133 ; G02F1/136 ; G02F1/1368 ; G09G3/00 ; H01L29/786
Abstract:
In the case where a possible defect of a liquid crystal panel is detected, after the liquid crystal panel is put into an oven with the liquid crystal panel being energized, a second inspecting pulse, which has a larger potential difference than a potential difference of a first inspecting pulse applied to a second signal line on an active matrix substrate, is applied to a second signal line. In the above method, since an insulating layer, which is on the verge of breakage, between a source line and the second signal line can be broken, a possible defect of the liquid crystal panel can be detected as a cross bright line by inspection for turning-on in the panel inspecting step. For this reason, in this method, accuracy of detecting a possible defect can be improved, and the number of S-G leaks in the market is decreased greatly, thereby improving display quality of the liquid crystal panel.
Public/Granted literature
- US5111104A Triple-enveloped metal-halide arc discharge lamp having lower color temperature Public/Granted day:1992-05-05
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