发明授权
- 专利标题: Sampler module, sampling waveform measurement device using the sample module, and sampling waveform measurement method
- 专利标题(中): 采样模块,采样模块采样波形测量装置,采样波形测量方法
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申请号: US651054申请日: 1996-05-21
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公开(公告)号: US5801375A公开(公告)日: 1998-09-01
- 发明人: Kouji Sasaki , Takao Sakurai , Takeshi Konno , Wataru Narazaki , Masaichi Hashimoto
- 申请人: Kouji Sasaki , Takao Sakurai , Takeshi Konno , Wataru Narazaki , Masaichi Hashimoto
- 申请人地址: JPX Tokyo
- 专利权人: Advantest Corporation
- 当前专利权人: Advantest Corporation
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX7-148331 19950523; JPX8-025480 19960213; JPX8-025481 19960213
- 主分类号: G01R13/34
- IPC分类号: G01R13/34 ; H01J3/14
摘要:
A sampler module is disclosed for use in a sampling waveform measurement device that samples subject signals and measures the waveform of the signals. The module is constructed by accommodating within a metal container: a laser diode driver circuit that receives laser drive sampling pulse signals from the outside and supplies pulse drive signals by a gain switching method, a laser diode that receives the drive signals from the LD driver circuit and generates optical probe pulse light, a sampling photoconductor that performs switching in accordance with irradiated light pulses and samples the subject signals, a condenser that focuses optical probe pulse light from the laser diode upon the photoconductor, and cooling temperature control means that maintains the temperature of the laser diode at a fixed temperature.
公开/授权文献
- USD245135S Table 公开/授权日:1977-07-26
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