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US5805500A Circuit and method for generating a read reference signal for nonvolatile memory cells 失效
用于产生用于非易失性存储单元的读取参考信号的电路和方法

Circuit and method for generating a read reference signal for
nonvolatile memory cells
摘要:
The current flowing through a cell to be read, forming part of a nonvolatile memory array and presenting a characteristic with a predetermined slope, is amplified N times and compared with a reference current presenting a two portion characteristic: a first portion extending between a predetermined threshold value and a trigger value, and presenting a slope equal to that of the memory cell characteristic, and a second portion extending from the trigger value, and presenting a slope amplified N times with respect to that of the cell characteristic and therefore equal to the amplified slope of the cell.
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