发明授权
- 专利标题: Surface analysis system and method
- 专利标题(中): 表面分析系统及方法
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申请号: US577947申请日: 1995-12-22
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公开(公告)号: US5809162A公开(公告)日: 1998-09-15
- 发明人: Andrei Csipkes , Muid Ur-Rehman Mufti , John Mark Palmquist
- 申请人: Andrei Csipkes , Muid Ur-Rehman Mufti , John Mark Palmquist
- 申请人地址: NJ Murray Hill
- 专利权人: Lucent Technologies Inc.
- 当前专利权人: Lucent Technologies Inc.
- 当前专利权人地址: NJ Murray Hill
- 主分类号: G02B6/38
- IPC分类号: G02B6/38 ; G06K9/00
摘要:
A surface analysis system can contactlessly, automatically, and rapidly detect, classify, and evaluate a surface of an object, particularly, an optical fiber end face, for discontinuities to derive a single pass/fail conclusion regarding the surface. The surface analysis system has a scope for capturing an image of the end face. A computer is connected to the scope. A machine vision system is associated with the computer for receiving the image. A surface analysis program is associated with the computer for driving the machine vision system. The program searches for any discontinuities in the image by analyzing each pixel and a corresponding pixel structure of pixels to determine whether a discontinuity resides at each pixel. Discontinuities are classified as one of the following: binary thresholds, local gradients, and directional gradients. The pixel structure includes a plurality of pixels that were previously analyzed. The program determines whether the surface is continuous based upon any discovered discontinuities.
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