发明授权
- 专利标题: Method for fabricating a semiconductor acceleration sensor
- 专利标题(中): 半导体加速度传感器的制造方法
-
申请号: US399342申请日: 1995-03-06
-
公开(公告)号: US5851851A公开(公告)日: 1998-12-22
- 发明人: Hirofumi Uenoyama , Masakazu Kanosue , Kenichi Ao , Yasutoshi Suzuki
- 申请人: Hirofumi Uenoyama , Masakazu Kanosue , Kenichi Ao , Yasutoshi Suzuki
- 申请人地址: JPX Kariya
- 专利权人: Nippondenso Co., Ltd.
- 当前专利权人: Nippondenso Co., Ltd.
- 当前专利权人地址: JPX Kariya
- 优先权: JPX6-036139 19940307; JPX6-036141 19940307
- 主分类号: G01P15/08
- IPC分类号: G01P15/08 ; G01P15/12 ; H01L21/78
摘要:
It is an object to provide a method of fabrication for a semiconductor acceleration sensor which can prevent destruction of a movable portion during dicing. A sacrificial layer composed of silicon oxide film is formed on a silicon substrate, and a movable member composed of polycrystalline silicon is formed on the sacrificial layer. A polyimide film is applied on the movable member at room temperature and heated to approximately 350.degree. C. to harden. The movable member is supported by this polyimide film. Accordingly, etching liquid penetration holes are formed on the polyimide film. Further, the sacrificial layer disposed between the movable member and the silicon substrate is etched away by means of dipping the silicon substrate into hydrofluoric acid-based etching liquid. Thereafter, the silicon substrate is dipped into demineralized water to replace the etching liquid with demineralized water, and subsequently the silicon substrate is dried. Accordingly, the silicon substrate is diced and thereafter the polyimide film is etched away by O.sub.2 ashing.
公开/授权文献
信息查询
IPC分类: