发明授权
US5859532A Method of and measuring arrangement for metal detection with a coil device having several separately controllable regions 失效
用具有多个单独可控区域的线圈装置进行金属检测的方法和测量装置

  • 专利标题: Method of and measuring arrangement for metal detection with a coil device having several separately controllable regions
  • 专利标题(中): 用具有多个单独可控区域的线圈装置进行金属检测的方法和测量装置
  • 申请号: US551651
    申请日: 1995-11-01
  • 公开(公告)号: US5859532A
    公开(公告)日: 1999-01-12
  • 发明人: Helmut Keller
  • 申请人: Helmut Keller
  • 申请人地址: DEX Eningen
  • 专利权人: Vallon GmbH
  • 当前专利权人: Vallon GmbH
  • 当前专利权人地址: DEX Eningen
  • 优先权: DEX19510506.0 19950323
  • 主分类号: G01V3/10
  • IPC分类号: G01V3/10 G01V3/11 G01N27/72 G01R33/12 G01V3/38
Method of and measuring arrangement for metal detection with a coil
device having several separately controllable regions
摘要:
In a method and a measuring device for metal detection with the use of a coil arrangement the spatially offset transmitting coils are controlled with pulse sequences of different pulse patterns. The receiving coils associated with the transmitting coils are scanned with respect to the received measuring signals with a scan pattern corresponding to the respective associated pulse pattern. It is therefore possible to control simultaneously all transmitting coils and to provide a spatial determination of a metal object located in a throughgoing region of a gate frame.
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