发明授权
- 专利标题: Method of manufacturing light beam scanning apparatus and fixed hologram plate and rotatable hologram and light distributing apparatus
- 专利标题(中): 制造光束扫描装置和固定全息板以及可旋转全息图和光分布装置的方法
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申请号: US453669申请日: 1995-05-30
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公开(公告)号: US5861964A公开(公告)日: 1999-01-19
- 发明人: Shinya Hasegawa , Shigeo Kayashima , Satoshi Maeda , Shigetake Iwata , Fumio Yamagishi , Masato Nakashima , Hirokazu Aritake , Mamoru Hokari
- 申请人: Shinya Hasegawa , Shigeo Kayashima , Satoshi Maeda , Shigetake Iwata , Fumio Yamagishi , Masato Nakashima , Hirokazu Aritake , Mamoru Hokari
- 申请人地址: JPX Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX3-62961 19910327; JPX3-14025 19910612; JPX3-275271 19911023; JPX3-277497 19911024; JPX3-277498 19911024; JPX3-277499 19911024; JPX3-277500 19911024; JPX3-320162 19911204; WOXPCT/JP92/00371 19920326
- 主分类号: G02B5/32
- IPC分类号: G02B5/32 ; G02B26/10 ; G03H1/12 ; G02B5/18 ; G02B26/08
摘要:
A high-resolution light-beam scanning apparatus utilizing only mass-producible holograms instead of utilizing auxiliary optical systems, and capable of compensating for disadvantages. The light-beam scanning apparatus including diffraction gratings for minimizing either: a sum total of values obtained by weighting a square of an optical path length difference between an optical path of a light flux measured along a principal axis of a light beam incident on and diffracted by a first diffraction grating of a rotatable hologram, and incident on and diffracted by a second diffraction grating of a fixed plate to conduct a scanning and converging on a scanning point on an image formation surface, and an optical path of a light flux measured along a marginal ray distanced from the principal axis or an absolute value of the optical path difference thereof; or a sum total of values obtained by weighting a square of a sum obtained by adding an amount of displacement of a light-beam convergent on a scanning point on the image formation surface, to an amount of displacement of the same light. The displacement measured with respect to the principal axis of a phase recorded on the diffraction grating when the light flux is incident on the fixed plate or by weighting an absolute value of the sum. The weighting is conducted at every scanning position of an image formation surface.
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