A semiconductor storage device is provided with a storage circuit for a faulty address and a plurality of redundant word lines corresponding to the storage circuit. The storage circuit is adapted to store a faulty address required for selecting a redundant word line. The faulty address is compared with an address input at the time of memory access by a comparator. Using a coincidence signal produced from the comparator and a predetermined address signal contained in the input address, a defect relief circuit selects one of the redundant word lines in place of the faulty word line.