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US5893949A Solid phase epitaxial crystallization of amorphous silicon films on insulating substrates 失效
绝缘基板上非晶硅膜的固相外延结晶

Solid phase epitaxial crystallization of amorphous silicon films on
insulating substrates
摘要:
A new process to form a polycrystalline silicon film using a polycrystalline silicon-germanium (poly-Si.sub.1-x Ge.sub.x) capping film to "seed" crystallization of an amorphous silicon film on an upper surface of a substrate. The polycrystalline silicon film has no nucleation sites and a greater number of grain boundaries in the region near the polycrystalline silicon upper surface than in the region near the polycrystalline silicon and substrate upper surface interface. This indicates that crystallization and crystal growth occurred from the polycrystalline silicon upper surface and proceeded in a direction towards the substrate upper surface.
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