发明授权
US5920773A Method for making integrated heterojunction bipolar/high electron
mobility transistor
失效
制造集成异质结双极/高电子迁移率晶体管的方法
- 专利标题: Method for making integrated heterojunction bipolar/high electron mobility transistor
- 专利标题(中): 制造集成异质结双极/高电子迁移率晶体管的方法
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申请号: US876277申请日: 1997-06-16
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公开(公告)号: US5920773A公开(公告)日: 1999-07-06
- 发明人: Madjid Hafizi , Julia J. Brown , William E. Stanchina
- 申请人: Madjid Hafizi , Julia J. Brown , William E. Stanchina
- 申请人地址: CA El Segundo
- 专利权人: Hughes Electronics Corporation
- 当前专利权人: Hughes Electronics Corporation
- 当前专利权人地址: CA El Segundo
- 主分类号: H01L21/285
- IPC分类号: H01L21/285 ; H01L21/331 ; H01L21/335 ; H01L21/338
摘要:
An integrated circuit technology combines heterojunction bipolar transistors (HBTs), high electron mobility transistors (HEMTs) and other components along with interconnect metallization on a single substrate. In a preferred embodiment a flat substrate is patterned, using dry etching, to provide one or more mesas in locations which will eventually support HEMTs. A device stack including HEMT and HBT layers is built up over the substrate by molecular beam epitaxy, with the active HEMT devices located on the mesas within openings in the HBT layer. In this way the active HEMT is aligned with the HBT layer to planarize the finished integrated circuit.
公开/授权文献
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