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US5924003A Method of manufacturing ball grid arrays for improved testability 失效
制造球栅阵列以提高可测性的方法

Method of manufacturing ball grid arrays for improved testability
摘要:
A ball grid array package for integrated circuit chips that is designed to facilitate testing. The balls are planarized with high precision to make electrical contact more accurate for testing. Contact, even on fine pitched arrays, can be readily made. A machine for planarizing the solder balls is disclosed. Also, a contact array, as well as a method of making the contact array are disclosed.
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