Invention Grant
- Patent Title: MOS transistor with impurity-implanted region
- Patent Title (中): 具有杂质注入区域的MOS晶体管
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Application No.: US735428Application Date: 1996-10-22
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Publication No.: US5936277APublication Date: 1999-08-10
- Inventor: Nobuyoshi Takeuchi
- Applicant: Nobuyoshi Takeuchi
- Applicant Address: JPX Tokyo
- Assignee: NKK Corporation
- Current Assignee: NKK Corporation
- Current Assignee Address: JPX Tokyo
- Priority: JPX7-283175 19951031
- Main IPC: H01L21/265
- IPC: H01L21/265 ; H01L21/266 ; H01L21/336 ; H01L29/10 ; H01L29/78 ; H01L27/088
Abstract:
A MOS transistor includes a semiconductor substrate of a first conductivity type having a major surface, a source and drain of a second conductivity type formed on the major surface to define a channel region therebetween, and a gate arranged in the channel region via an insulating film. The MOS transistor includes an impurity-implanted region of the first conductivity type located at a substrate portion which is deeper than the channel region and is shifted to a source side from a region corresponding to the channel region.
Public/Granted literature
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Information query
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