发明授权
- 专利标题: Structure and method of measuring electrical characteristics of a molecule
- 专利标题(中): 测量分子电特性的结构和方法
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申请号: US24147申请日: 1998-02-17
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公开(公告)号: US5945832A公开(公告)日: 1999-08-31
- 发明人: Thomas B. Harvey, III , Chan-Long Shieh
- 申请人: Thomas B. Harvey, III , Chan-Long Shieh
- 申请人地址: IL Schaumburg
- 专利权人: Motorola, Inc.
- 当前专利权人: Motorola, Inc.
- 当前专利权人地址: IL Schaumburg
- 主分类号: G01N27/07
- IPC分类号: G01N27/07 ; G01R27/08
摘要:
A method of measuring electrical characteristics of a molecule including providing a first metal contact having a major surface, an insulating layer overlying the major surface of the first metal contact and a second metal contact overlying the insulating layer so as to have an edge spaced a molecular distance from the major surface of the first metal contact. A conductive organic molecule including a metal binding group is coupled between the metal contacts.
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