Invention Grant
US5962852A Process and device for determining an analyte contained in a scattering
matrix
失效
用于确定包含在散射矩阵中的分析物的方法和装置
- Patent Title: Process and device for determining an analyte contained in a scattering matrix
- Patent Title (中): 用于确定包含在散射矩阵中的分析物的方法和装置
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Application No.: US875349Application Date: 1997-07-28
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Publication No.: US5962852APublication Date: 1999-10-05
- Inventor: Alexander Knuettel , Dirk Boecker , Matthias Essenpreis
- Applicant: Alexander Knuettel , Dirk Boecker , Matthias Essenpreis
- Applicant Address: DEX Mannheim
- Assignee: Roche Diagnostics GmbH
- Current Assignee: Roche Diagnostics GmbH
- Current Assignee Address: DEX Mannheim
- Priority: DEX19602656 19960126
- Main IPC: A61B5/00
- IPC: A61B5/00 ; G01N21/49
Abstract:
Method for determining an analyte in a scattering matrix. In a detection step detection measurements are made in which light is irradiated into the matrix as primary light and light leaving the scattering matrix is detected as secondary light, in order to determine as a measurement quantity a measurable physical property of the light which is variable due to the interaction of the light with the matrix. Information on the presence of the analyte in the matrix is determined in an evaluation step. The determination of optically weakly absorbing analytes against a strongly absorbing interference background is improved by the use of two selection methods for the depth selective detection of the secondary light in combination with one another. Primary light is focused by means of a primary light optically focussing element onto a region of focus lying in the matrix at a predetermined measuring depth and the region of focus is imaged by means of a secondary light optically focusing element onto a light entry aperture arranged in the light path of the secondary light to the detector. In addition to this first depth selection by a confocal arrangement, a second depth selection device is used to detect light reflected from a defined measuring depth as secondary light, with the measuring depth coinciding with the depth of focus.
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