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US5982666A Sense amplifier circuit for semiconductor memory devices 失效
用于半导体存储器件的感测放大器电路

Sense amplifier circuit for semiconductor memory devices
摘要:
A sense amplifier circuit for a semiconductor memory device comprises first current/voltage conversion means for converting a current of a memory cell to be read into a voltage signal, second current voltage/conversion means for converting a reference current into a reference voltage signal, and voltage comparator means for comparing the voltage signal with the reference voltage signal. The sense amplifier circuit comprises capacitive decoupling means for decoupling the voltage signal from the comparator means, and means for providing the capacitive decoupling means with an electric charge suitable for compensating an offset voltage introduced in the voltage signal by an offset current superimposed on the current of the memory cell to be read.
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