发明授权
- 专利标题: Mass analyzer
- 专利标题(中): 质量分析仪
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申请号: US921365申请日: 1997-08-29
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公开(公告)号: US5986260A公开(公告)日: 1999-11-16
- 发明人: Mitsuru Oonuma , Seiji Kamimura , Tadao Mimura
- 申请人: Mitsuru Oonuma , Seiji Kamimura , Tadao Mimura
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX8-229816 19960830
- 主分类号: H01J49/04
- IPC分类号: H01J49/04
摘要:
A mass analyzer comprising a sample preparation mechanism for preliminarily preparing an analyzing sample, an interface mechanism for preparing the sample into ions after the required preliminary preparation, an ion trapping part and analyzing part for analyzing the ions, and a controller. The ion trapping part and analyzing part is placed in a box portion of the body, while the interface mechanism is arranged on the front top of the box portion of the body. When the cover at the front top is removed, the front, top and right side of the interface mechanism are opened.
公开/授权文献
- US5214297A High-speed semiconductor device 公开/授权日:1993-05-25