发明授权
US6005245A Method and apparatus for ionizing a sample under atmospheric pressure
and selectively introducing ions into a mass analysis region
失效
用于在大气压下电离样品并选择性地将离子引入质量分析区域的方法和装置
- 专利标题： Method and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis region
- 专利标题（中）： 用于在大气压下电离样品并选择性地将离子引入质量分析区域的方法和装置
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申请号： US919785申请日： 1997-08-29
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公开(公告)号： US6005245A公开(公告)日： 1999-12-21
- 发明人: Minoru Sakairi , Tadao Mimura , Yasuaki Takada , Takayuki Nabeshima , Hideaki Koizumi
- 申请人： Minoru Sakairi , Tadao Mimura , Yasuaki Takada , Takayuki Nabeshima , Hideaki Koizumi
- 申请人地址： JPX Tokyo
- 专利权人： Hitachi, Ltd.
- 当前专利权人： Hitachi, Ltd.
- 当前专利权人地址： JPX Tokyo
- 优先权： JPX5-232833 19930920; JPX7-280159 19951027
- 主分类号： H01J49/04
- IPC分类号： H01J49/04 ; H01J49/06
摘要：
A method in which cutting of small droplets, neutral particles or photons through to a slit provided between a differential pumping portion and a mass analysis portion is combined with slight deflection of ions just before introduction of the ions into the mass analysis portion so that noises are greatly reduced without reduction of signals to thereby improve the signal-to-noise ratio which is an index of detecting sensitivity or lower limit.
公开/授权文献
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