发明授权
US06013951A Semiconductor device having an improved lead connection structure and manufacturing method thereof 失效
具有改进的引线连接结构的半导体器件及其制造方法

Semiconductor device having an improved lead connection structure and
manufacturing method thereof
摘要:
A first polycide lead, which is formed on a silicon substrate, consists of a first doped polysilicon layer and a first tungsten silicide layer that is formed on the first doped polysilicon layer. An interlayer insulating film, which is formed on the silicon substrate, has an opening that reaches the first doped polysilicon layer. A second polycide lead, which is formed on the interlayer insulating film, consists of a second doped polysilicon layer that is connected to the first polycide lead in the opening and a second tungsten silicide layer that is formed on the second doped polysilicon layer. In the opening, the first and second doped polysilicon layers are in contact with each other at the side surfaces of the first polycide lead.
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