Invention Grant
- Patent Title: Sample analysis system
- Patent Title (中): 样品分析系统
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Application No.: US46683Application Date: 1998-03-24
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Publication No.: US6019945APublication Date: 2000-02-01
- Inventor: Tadashi Ohishi , Masaaki Hanawa , Susumu Kai , Hiroshi Mitsumaki , Hideyuki Yanami
- Applicant: Tadashi Ohishi , Masaaki Hanawa , Susumu Kai , Hiroshi Mitsumaki , Hideyuki Yanami
- Applicant Address: JPX Tokyo
- Assignee: Hitachi Ltd.
- Current Assignee: Hitachi Ltd.
- Current Assignee Address: JPX Tokyo
- Priority: JPX9-074157 19970326
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/00 ; G01N35/04
Abstract:
A sample analysis system includes blood serum analysis units, blood plasma analysis units and urine analysis units which are arranged along a main conveyor line. The width size of each analysis unit on the side along the main conveyor line is the same. Each analysis unit can be removed integral with a sampling line and its rack transfer device from, the main conveyor line. Removed analysis units can be replaced by each other without changing the entry and exit positions for the sample rack. The conveyor line has the same number of line frame segments as the number of the analysis units.
Public/Granted literature
- USD396874S Sunglasses Public/Granted day:1998-08-11
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