发明授权
US6034563A Semiconductor integrated circuit having reduced current leakage and high
speed
失效
半导体集成电路具有降低的电流泄漏和高速度
- 专利标题: Semiconductor integrated circuit having reduced current leakage and high speed
- 专利标题(中): 半导体集成电路具有降低的电流泄漏和高速度
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申请号: US651588申请日: 1996-05-22
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公开(公告)号: US6034563A公开(公告)日: 2000-03-07
- 发明人: Koichiro Mashiko
- 申请人: Koichiro Mashiko
- 申请人地址: JPX Tokyo
- 专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人: Mitsubishi Denki Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX7-271574 19951019
- 主分类号: H01L27/088
- IPC分类号: H01L27/088 ; G11C11/407 ; H01L21/8234 ; H01L27/02 ; H03K17/16 ; H03K19/00 ; H03K19/0175 ; H03K19/0948 ; G05F1/10
摘要:
A semiconductor integrated circuit including a first MOS transistor supplied with a first power supply voltage and having a high threshold voltage; a second MOS transistor supplied with a second power supply voltage and having the high threshold voltage; a logic circuit connected between the first transistor and the second transistor and including a plurality of MOS transistors having a low threshold voltage; a control circuit for generating a control signal when the logic circuit is in a standby state; and a voltage generating circuit for generating a first voltage which is a higher than the first power supply voltage and a second voltage which is a lower than the second power supply voltage, for supplying the first voltage to a gate of the first MOS transistor and for supplying the second voltage to a gate of the second MOS transistor when the logic circuit is in the standby state, thereby to decrease leakage current through the first and second transistors and through the logic circuit when in the standby state.
公开/授权文献
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