发明授权
- 专利标题: Method for stabilizing feedback loop of impedance measuring apparatus
- 专利标题(中): 稳定阻抗测量仪反馈回路的方法
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申请号: US892960申请日: 1997-07-16
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公开(公告)号: US6054867A公开(公告)日: 2000-04-25
- 发明人: Hideki Wakamatsu
- 申请人: Hideki Wakamatsu
- 申请人地址: CA Palo Alto
- 专利权人: Hewlett-Packard Company
- 当前专利权人: Hewlett-Packard Company
- 当前专利权人地址: CA Palo Alto
- 优先权: JPX8-197200 19960726
- 主分类号: G01R27/02
- IPC分类号: G01R27/02 ; G01R27/28
摘要:
A method for stabilizing feedback loop in impedance measuring equipment involves determining a null loop transfer function of the impedance measuring device by utilizing multiple independent, known impedances. The phase characteristics of the null loop is measured for each multiple independent, known impedances. Based on the measured phase characteristics, the loop characteristic is determined with regard to impedances of arbitrary devices under test (DUTs). The best phase compensation amount is then computed for use over the entire range of DUTs.
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