发明授权
US6073253A Enhanced reset and built-in self-test mechanisms for single function and
multifunction input/output devices
失效
增强的复位和内置自检机构,用于单功能和多功能输入/输出设备
- 专利标题: Enhanced reset and built-in self-test mechanisms for single function and multifunction input/output devices
- 专利标题(中): 增强的复位和内置自检机构,用于单功能和多功能输入/输出设备
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申请号: US995075申请日: 1997-12-19
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公开(公告)号: US6073253A公开(公告)日: 2000-06-06
- 发明人: Gregory Michael Nordstrom , Shawn Michael Lambeth , Paul Edward Movall , Daniel Frank Moertl , Charles Scott Graham , Paul John Johnsen , Thomas Rembert Sand
- 申请人: Gregory Michael Nordstrom , Shawn Michael Lambeth , Paul Edward Movall , Daniel Frank Moertl , Charles Scott Graham , Paul John Johnsen , Thomas Rembert Sand
- 申请人地址: NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: G06F1/24
- IPC分类号: G06F1/24 ; G06F11/267 ; G06F11/00
摘要:
An apparatus, system and method permitting a variety of reset procedures and corresponding reset states. A device reset control register is provided for each I/O device adapter in single function or multifunction devices. The device reset control registers permit a greater degree of control over single function devices, multifunction device as a whole and individual device functions within a multifunction device. A device immediate status register synchronizes the various reset procedures. A logical power on reset procedure, a directed unit reset procedure and a directed interface reset procedure utilize the greater degree of control that the device reset control registers provide to force the I/O device adapter, single function device or multifunction device into a corresponding logical power on reset state, a directed unit reset state or a directed interface reset state. Each of these reset states is well-defined and has the advantage of predictable behavior during and after execution of the corresponding reset procedure. A built-in self-test procedure is also defined that sequentially examines each function associated within a multifunction device connected to the local bus to coordinate the initiation, execution and completion of built in self-tests.
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