发明授权
- 专利标题: Micron-scale differential scanning calorimeter on a chip
- 专利标题(中): 微米级差示扫描量热仪在芯片上
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申请号: US107064申请日: 1998-06-30
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公开(公告)号: US6079873A公开(公告)日: 2000-06-27
- 发明人: Richard E. Cavicchi , Gregory Ernest Poirier , John S. Suehle , Michael Gaitan , Nim H. Tea
- 申请人: Richard E. Cavicchi , Gregory Ernest Poirier , John S. Suehle , Michael Gaitan , Nim H. Tea
- 申请人地址: DC Washington
- 专利权人: The United States of America as represented by the Secretary of Commerce
- 当前专利权人: The United States of America as represented by the Secretary of Commerce
- 当前专利权人地址: DC Washington
- 主分类号: G01N25/48
- IPC分类号: G01N25/48 ; G01N25/00
摘要:
A differential scanning microcalorimeter produced on a silicon chip enables microscopic scanning calorimetry measurements of small samples and thin films. The chip may be fabricated using standard CMOS processes. The microcalorimeter includes a reference zone and a sample zone. The reference and sample zones may be at opposite ends of a suspended platform or may reside on separate platforms. An integrated polysilicon heater provides heat to each zone. A thermopile consisting of a succession of thermocouple junctions generates a voltage representing the temperature difference between the reference and sample zones. Temperature differences between the zones provide information about the chemical reactions and phase transitions that occur in a sample placed in the sample zone.
公开/授权文献
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