发明授权
US6105149A System and method for diagnosing and validating a machine using waveform
data
失效
使用波形数据诊断和验证机器的系统和方法
- 专利标题: System and method for diagnosing and validating a machine using waveform data
- 专利标题(中): 使用波形数据诊断和验证机器的系统和方法
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申请号: US50143申请日: 1998-03-30
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公开(公告)号: US6105149A公开(公告)日: 2000-08-15
- 发明人: Piero Patrone Bonissone , Yu-To Chen , Vipin Kewal Ramani , Rasiklal Punjalal Shah , John Andrew Johnson , Phillip Edward Steen , Ramesh Ramachandran
- 申请人: Piero Patrone Bonissone , Yu-To Chen , Vipin Kewal Ramani , Rasiklal Punjalal Shah , John Andrew Johnson , Phillip Edward Steen , Ramesh Ramachandran
- 申请人地址: NY Schenectady
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: NY Schenectady
- 主分类号: G01R33/28
- IPC分类号: G01R33/28 ; A61B5/055 ; G06F9/44 ; G06F11/22 ; G06F11/25 ; G06F19/00 ; G06N5/04 ; G06F11/00
摘要:
The present invention discloses a system and method for diagnosing and validating a machine with waveform data generated therefrom. In this invention, historical waveform data are obtained from machines having known faults along with corresponding actions for repairing the machines and are used to develop fault classification rules. The fault classification rules are stored in a diagnostic knowledge database. The database of classification rules are used to diagnose new waveform data from a machine having an unknown fault.
公开/授权文献
- USD392255S IC card connector 公开/授权日:1998-03-17
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