发明授权
- 专利标题: Apparatus for measuring resistance of electronic component
- 专利标题(中): 用于测量电子部件的电阻的装置
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申请号: US74177申请日: 1998-05-07
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公开(公告)号: US6127828A公开(公告)日: 2000-10-03
- 发明人: Gaku Kamitani
- 申请人: Gaku Kamitani
- 申请人地址: JPX
- 专利权人: Murata Manufacturing Co., Ltd.
- 当前专利权人: Murata Manufacturing Co., Ltd.
- 当前专利权人地址: JPX
- 优先权: JPX9-135814 19970509; JPX9-348616 19971202
- 主分类号: G01R27/02
- IPC分类号: G01R27/02 ; G01R31/00 ; G01R31/01 ; G01R31/12
摘要:
An apparatus for measuring the insulation resistance of an electronic component, such as a capacitor 5, capable of reliable detection of contact even for an electronic component having a small capacitance, in which the capacitor 5 is retained in a retaining groove 21 on a turn table 20. Contact electrodes 13a and 13b are provided on the bottom of the retaining groove 21, and a dummy capacitor 12 is connected to the contact electrodes 13a and 13b is secured to the rear surface of the turn table 20. Measuring terminals 7a and 7b are put in contact with electrodes of the capacitor 5, and an AC current is applied to detect contact from the output thereof. After the detection of contact, a DC voltage is applied from the measuring terminals 7a and 7b, and the insulation resistance of the capacitor 5 is obtained by detecting a leakage current therefrom.
公开/授权文献
- USD429218S Stackable coupler for electrical cables 公开/授权日:2000-08-08
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