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公开(公告)号：US12061232B2
公开(公告)日：2024-08-13
申请号：US17402382
申请日：2021-08-13
申请人： Tektronix, Inc.
IPC分类号： G01R31/317 , G01R31/01 , G06F11/273
CPC分类号： G01R31/31715 , G01R31/01 , G01R31/31713 , G06F11/2733
摘要： A margin tester including an identification reader configured to receive an adaptor identifier of an adaptor, an interface configured to connect to a device under test through the adaptor, and one or more processors configured to assess a margin, such as an electrical margin or an optical margin, of a device under test and tag the assessment with the adaptor identifier. Assessing the margin can include assessing the margin based on an expected margin that is predicted or provided based on the adaptor identifier.
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公开(公告)号：US20240162064A1
公开(公告)日：2024-05-16
申请号：US18420068
申请日：2024-01-23
发明人： Chih-Hung HUANG , Cheng-Lung WU , Zheng-Lin HE , Yang-Ann CHU , Jiun-Rong PAI , Hsuan LEE
IPC分类号： H01L21/67 , B07C5/34 , G01R31/01 , H01L21/677
CPC分类号： H01L21/67271 , B07C5/3412 , G01R31/01 , H01L21/67703
摘要： A die sorter tool may include a first conveyor, and a first lane to receive, from one or more load ports and via the first conveyor, a carrier with a set of dies. The die sorter tool may include a die flip module to receive the carrier from the first lane, manipulate one or more dies of the set of dies by changing orientations of the one or more dies, and return the one or more dies to the carrier after manipulating the one or more dies and without changing positions of the one or more dies within the carrier. The die sorter tool may include a second conveyor, and a second lane to receive, via the second conveyor, the carrier from the die flip module, and provide, via the first conveyor, the carrier to the one or more load ports.
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公开(公告)号：US20240125839A1
公开(公告)日：2024-04-18
申请号：US18380337
申请日：2023-10-16
摘要： An emulator system for testing an electrical product in a closed circuit, including a first power electronic structure to emulate a voltage source, connectable to the input of the electrical product; a second power electronic structure to emulate an electronic load, connectable to the output of the electrical product; a direct current bus connected between the first and second structure; a power supply configured to be connected to a general electrical grid and power the bus; and a control module in communication with all elements of the system. Once the electrical product is connected between the emulated source and load, a closed circuit is established in which the emulated source consumes power from the bus to test the product and the emulated electronic load reinjects the power consumed into the bus.
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公开(公告)号：US11614499B2
公开(公告)日：2023-03-28
申请号：US17133378
申请日：2020-12-23
摘要： An apparatus includes a resistor having a resistor terminal. The apparatus includes a capacitor coupled to the resistor terminal. The apparatus includes a transistor having a current terminal and a gate. The gate is coupled to the resistor terminal and coupled to the capacitor. The apparatus includes a comparator having a comparator input and a comparator output. The comparator input is coupled to the current terminal. The apparatus includes a latch having a latch input coupled to the comparator output.
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5.发明授权公开(公告)号：US11346893B2
公开(公告)日：2022-05-31
申请号：US16766691
申请日：2018-11-05
申请人： ZIEHL-ABEGG SE
发明人： Marco Schnell
摘要： A method for determining the remaining service life of a capacitor is disclosed, wherein the capacitor may be formed by an electrolytic capacitor. The method includes the stages of: measuring a voltage change across the capacitor during a discharging time, determining a discharging current during the discharging time, determining an actual capacitance of the capacitor on the basis of the voltage change, the discharging current and the discharging time, determining a corrected capacitance of the capacitor from the actual capacitance based on an error correction, wherein influences of the temperature on the capacitance of the capacitor are corrected during the error correction, and determining the remaining service life on the basis of a difference between the corrected capacitance and an initial capacitance of the capacitor. A system including an assessment device, configured to perform this method, and a circuit having at least one capacitor to be assessed are also disclosed.
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公开(公告)号：US11270056B2
公开(公告)日：2022-03-08
申请号：US16986874
申请日：2020-08-06
发明人： Yizhak Bot , Alex Gonorovsky , Isaac Rosenstein
IPC分类号： G06F30/398 , G06F30/3308 , G01R31/3183 , G01R31/01 , G06F30/333
摘要： A method, system and computer program product, the method comprising: obtaining circuit information, comprising description of groups of pins of electronic chips; obtaining a description of a test comprising a plurality of rules specifying: an identifier, a first group of pins, a second group of pins, a first action to take upon successful interconnection of the first and second groups, and a second action to take upon failure, wherein the first action and second actions are one of: finish with success, finish with failure, and a rule ID of a subsequent rule to check; checking the plurality of rules, comprising checking a sequence of rules starting with a first rule, and wherein each subsequent rule is selected as the first or second action of a preceding rule, in accordance with whether the preceding rule succeeded or failed, respectively; and outputting a result of the plurality of rules.
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公开(公告)号：US11147519B2
公开(公告)日：2021-10-19
申请号：US16426225
申请日：2019-05-30
发明人： Youngbeom Kim , Doohee Lee , Jongho Lee , Junki Lee , Sangyoung Zho
摘要： Imperfect RF pulses in a multi-spin-echo (MSE) sequence disturb prediction of relaxation times. Provided are a magnetic resonance imaging (MRI) apparatus and method of operating the same, whereby a characteristic parameter value may be acquired from MR signal data via training using an artificial neural network (ANN) and a parametric map may be generated based on the acquired characteristic parameter value. The ANN may be trained to compensate for imperfect RF pulses while providing reduced computation times to produce an output image.
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公开(公告)号：US11143700B2
公开(公告)日：2021-10-12
申请号：US16582758
申请日：2019-09-25
发明人： Venkat Krishnan Ravikumar , Nathan Linarto , Wen Tsann Lua , Abel Tan Yew Hong , Shei Lay Phoa , Gopinath Ranganathan , Jiann Minn Chin
IPC分类号： G01R31/28 , G01R31/265 , G01R31/311 , G01R31/01 , G01R23/17 , G01R29/08
摘要： An optic probe is used to measure signals from a device under test. The optic probe is positioned at a target probe location within a cell of the device under test, the cell including a target net to be measured and a plurality of non-target nets. A test pattern is applied to the cell with the optic probe a laser probe (LP) waveform is obtained in response. A target net waveform is extracted from the LP waveform by: (i) simulating a combinational logic analysis (CLA) cross-talk waveform to model cross-talk from selected non-target nets by simulating an optical response of the cell to the test pattern with the target net masked; (ii) estimating a cross-talk weight; and (iii) determining a target net waveform by weighting the CLA cross-talk waveform according to the cross-talk weight and subtracting the weighted CLA cross-talk waveform from the LP waveform.
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9.发明申请公开(公告)号：US20210302486A1
公开(公告)日：2021-09-30
申请号：US17218374
申请日：2021-03-31
申请人： AVX Corporation
发明人： Howard Bernier , Daniel Yocz , Glenn Vaillancourt , Jason Laforge
摘要： A method of screening a lot of capacitors is provided. The method includes measuring a first leakage current of each individual capacitor in a first set of capacitors and calculating a first mean leakage current; removing each of the individual capacitors having a measured first leakage current equal to or above a first predetermined value, forming a second set of capacitors; subjecting the second set of capacitors to a burn in treatment; measuring a second leakage current for each of the individual capacitors in the second set and calculating a second mean leakage current; comparing the second leakage current for each of the individual capacitors to the first leakage current for each of the individual capacitors; and removing each of the individual capacitors having a second leakage current equal to or above a second predetermined value and/or having a second leakage current that does not change by a specified amount compared to the first leakage current for each of the individual capacitors.
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公开(公告)号：US20210247434A1
公开(公告)日：2021-08-12
申请号：US16973981
申请日：2019-06-11
摘要： Disclosed is a method for detecting a malfunction of a voltage-limiting circuit of a control circuit, the control circuit including an output port connected to a capacitive actuator of a motor vehicle, an output voltage on the output port being, in the absence of a malfunction of the voltage-limiting circuit, equal to or lower than a theoretical maximum value. The capacitive actuator is arranged in series with a commutator, the method including steps of: placing the commutator in an open state; activating the control circuit; measuring the output voltage over the output port; and evaluating a criterion for detecting a malfunction of the voltage-limiting circuit as a function of the output voltage.
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