发明授权
US6130746A System and method for electronically evaluating predicted fabric
qualities
失效
用于电子评估预测织物质量的系统和方法
- 专利标题： System and method for electronically evaluating predicted fabric qualities
- 专利标题（中）： 用于电子评估预测织物质量的系统和方法
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申请号： US603587申请日： 1996-02-21
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公开(公告)号： US6130746A公开(公告)日： 2000-10-10
- 发明人: Avishai Nevel , Kendall W. Gordon, Jr. , David Bonneau
- 申请人： Avishai Nevel , Kendall W. Gordon, Jr. , David Bonneau
- 申请人地址： RI Central Falls
- 专利权人： Lawson-Hemphill, Inc.
- 当前专利权人： Lawson-Hemphill, Inc.
- 当前专利权人地址： RI Central Falls
- 主分类号： G01B11/10
- IPC分类号： G01B11/10 ; G01N21/89 ; G01N21/898 ; G01N33/36
摘要：
A system or method for electronically simulating fabrics to assist in grading yarn and fabric qualities, in which the diameter or other qualities of one or more yarn samples along the total length of the samples is measured, and representations of the measured yarn qualities are evaluated in a fabric pattern to assist evaluation of the effects of the yarn quality variations on fabric which potentially would be produced from the sampled yarn.
公开/授权文献
- US5099116A Optical device for measuring displacement 公开/授权日：1992-03-24
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