Invention Grant
- Patent Title: Diagnostic procedures in an integrated circuit device
- Patent Title (中): 集成电路设备中的诊断程序
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Application No.: US995255Application Date: 1997-12-19
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Publication No.: US6134652APublication Date: 2000-10-17
- Inventor: Robert Warren
- Applicant: Robert Warren
- Applicant Address: GBX Almondsbury Bristol
- Assignee: SGS-Thomson Microelectronics Limited
- Current Assignee: SGS-Thomson Microelectronics Limited
- Current Assignee Address: GBX Almondsbury Bristol
- Priority: GBX9626401 19961219
- Main IPC: G06F11/28
- IPC: G06F11/28 ; G06F11/22 ; G06F11/36 ; G06F15/00
Abstract:
An on-chip breakpoint unit of an integrated circuit device is connected to receive the contents of an instruction pointer register via an address communication path. The breakpoint unit has a breakpoint register configured to hold a breakpoint address at which the normal operation of the CPU is to be interrupted for diagnostic purposes, and a comparator circuit operative to compare the breakpoint address with the contents of the instruction pointer register and to issue a breakpoint signal on a breakpoint signal path when there is a match. The on-chip breakpoint unit also has circuitry configured to inhibit generation of the breakpoint signal for a next instruction to be executed upon resumption of normal operation of the CPU after it has been interrupted.
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