Invention Grant
US6137859A Method for manufacturing detector system for a computed tomography
apparatus
失效
用于计算机断层摄影装置的检测器系统的制造方法
- Patent Title: Method for manufacturing detector system for a computed tomography apparatus
- Patent Title (中): 用于计算机断层摄影装置的检测器系统的制造方法
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Application No.: US247595Application Date: 1999-02-10
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Publication No.: US6137859APublication Date: 2000-10-24
- Inventor: Thomas Von Der Haar , Gerhard Kohl , Herbert Bruder
- Applicant: Thomas Von Der Haar , Gerhard Kohl , Herbert Bruder
- Applicant Address: DEX Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DEX Munich
- Priority: DEX19811044 19980313
- Main IPC: A61B6/03
- IPC: A61B6/03 ; G01T1/161 ; G01T1/29 ; G01N23/04
Abstract:
In a method for manufacturing a detector system composed of a number of detector elements respectively disposed at installation positions in a computed tomography (CT) apparatus, the detector elements are allocated to respective installation positions on the basis of a table that, for at least one image-relevant physical property, contains at least the allowable upper limit value or the allowable lower limit value for the individual installation positions for the deviation of the property with respect to a detector element occupying a neighboring installation position.
Public/Granted literature
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